Hanoi University of Science and Technology (HUST)https://hust.edu.vn/uploads/sys/logo-website02_136_200_1.png
Monday - 08/07/2024 05:19
On 08/07, at Korea Advanced Institute of Science and Technology (KAIST), South Korea, Assoc. Prof. Nguyen Phong Dien, Vice President of HUST, and Prof. So Young Kim, Vice President of KAIST, signed an MoU to combine their institutions' strengths in tackling science and technology challenges globally. On the same day, Assoc. Prof. Hoang Si Hong, Vice Dean of the School of Electrical and Electronic Engineering (SEEE) at HUST, and Prof. Joonhyuk Kang, Head of the Electrical Engineering Department at KAIST, signed a separate agreement to promote the development of satellite system technology.
At the ceremony, Assoc. Prof. Nguyen Phong Dien, Vice President of HUST, emphasized that the signing of the agreement is not just a formal arrangement but also marks the beginning of a journey toward shared goals and common aspirations. “Our institutions will collaborate on joint research projects, faculty and student exchanges, and knowledge sharing. This partnership will offer invaluable opportunities for students and researchers at HUST promoting innovations in satellite system technology, as well as contributing to the global scientific community and society,” he affirmed.
On behalf of KAIST, Prof. So Young Kim, Vice President of KAIST, expressed hope that the collaboration would foster mutual development and knowledge exchange, promote joint research initiatives, and attract talented HUST graduates passionate about satellite technology to tackle complex challenges and drive technological innovation.
Under the agreement, KAIST, one of the most prestigious global institutions for science and technology research, commits to supporting HUST in training students in satellite system technology, promoting the exchange of faculty, scholars, students, as well as academic information and materials. The partnership also aims to enhance mutual understanding between the faculty, scholars, and students of both institutions.